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My research is focused on the study of the crystalline structure of materials and their physical properties through transmission electron microscopy (TEM) and electron diffraction. Physical properties (magnetic, optical, electric and mechanical properties) are measured in situ TEM, in which individual nanostructures are exposed to external stimuli and recorded in real time. Electron microscopy methods include off-axis electron holography, high resolution transmission electron microscopy, aberration-corrected TEM and STEM, and electron diffraction under different modes: SAED, Scanning NBD and Crystal orientation mapping using precession electron diffraction. My work covers both, theory and experimental aspects of the crystalline structure/physical property relationships based on the electron-matter phenomena.
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