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This is a "connection" page, showing publications co-authored by Paresh C. Ray and Qilin Dai.
Paresh C. Ray
Connection Strength
0.048
Qilin Dai
  1. Das P, Nash J, Webb M, Burns R, Mapara VN, Ghimire G, Rosenmann D, Divan R, Karaiskaj D, McGill SA, Sumant AV, Dai Q, Ray PC, Tawade B, Raghavan D, Karim A, Pradhan NR. High broadband photoconductivity of few-layered MoS2 field-effect transistors measured using multi-terminal methods: effects of contact resistance. Nanoscale. 2020 Nov 26; 12(45):22904-22916.
    View in: PubMed
    Score: 0.048
Connection Strength

The connection strength for concepts is the sum of the scores for each matching publication.

Publication scores are based on many factors, including how long ago they were written and whether the person is a first or senior author.
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