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Connection

Miguel Jose-Yacaman to Semiconductors

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This is a "connection" page, showing publications Miguel Jose-Yacaman has written about Semiconductors.
Miguel Jose-Yacaman
Connection Strength
0.021
Semiconductors
  1. Allard LF, Bigelow WC, Jose-Yacaman M, Nackashi DP, Damiano J, Mick SE. A new MEMS-based system for ultra-high-resolution imaging at elevated temperatures. Microsc Res Tech. 2009 Mar; 72(3):208-15.
    View in: PubMed
    Score: 0.021
Connection Strength

The connection strength for concepts is the sum of the scores for each matching publication.

Publication scores are based on many factors, including how long ago they were written and whether the person is a first or senior author.
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